Journal
BEILSTEIN JOURNAL OF NANOTECHNOLOGY
Volume 14, Issue -, Pages 1169-1177Publisher
BEILSTEIN-INSTITUT
DOI: 10.3762/bjnano.14.97
Keywords
Au/mica; Au/Si; conductive atomic force microscopy; dodecanethiol; self-assembled monolayers
Ask authors/readers for more resources
Determining the conductivity of molecular layers is crucial in molecular electronics. We utilized conductive atomic force microscopy to investigate the influence of gold substrate roughness on conductivity variation, finding that substrate roughness plays a crucial role.
Determining the conductivity of molecular layers is a crucial step in advancing towards applications in molecular electronics. A common test bed for fundamental investigations on how to acquire this conductivity are alkanethiol layers on gold substrates. A widely used approach in measuring the conductivity of a molecular layer is conductive atomic force microscopy. Using this method, we investigate the influence of a rougher and a flatter gold substrate on the lateral variation of the conductivity. We find that the roughness of the substrate crucially defines this variation. We conclude that it is paramount to adequately choose a gold substrate for investigations on molecular layer conductivity.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available