4.6 Article

Sputtered Cu-doped NiO thin films as an efficient electrocatalyst for methanol oxidation

Journal

RSC ADVANCES
Volume 13, Issue 16, Pages 10818-10829

Publisher

ROYAL SOC CHEMISTRY
DOI: 10.1039/d3ra00380a

Keywords

-

Ask authors/readers for more resources

In this study, Cu-doped NiO thin films of different thicknesses were successfully prepared on fluorine-doped tin oxide (FTO) using the co-sputtering deposition technique. The prepared films showed ideal crystallinity and purity, as confirmed by X-ray diffraction (XRD) and energy-dispersive X-ray spectroscopy (EDS). Field emission scanning electron microscopy (FESEM) images revealed an increase in film thickness with increasing deposition time. The Cu-doped NiO thin films exhibited high electrocatalytic performance for methanol oxidation, with the highest activity observed in 1 M methanol. The film thickness had a clear impact on the catalytic activity, and Cu-doped NiO films showed good adhesion and electrical contact with the FTO substrate, eliminating the need for binders or conducting agents.
The efficient electrocatalysts for direct methanol oxidation play an essential role in the electrochemical energy conversion systems for their application in a wide range of portable applications. Consequently, Cu-doped NiO thin films on fluorine-doped tin oxide (FTO) were successfully prepared by the co-sputtering deposition technique, using various deposition times (300, 600, 900, and 1200 seconds), and producing films of different thicknesses (30, 55, 90, and 120 nm, respectively). X-ray diffraction (XRD) revealed the ideal crystallinity of the structure of the prepared films and was used to observe the effect of the thickness of the films on the crystal size. Energy-dispersive X-ray spectroscopy (EDS) confirmed the purity of the deposited film without any contamination. Field emission scanning electron microscopy (FESEM) images confirmed the film thickness increase with increasing deposition time. The surface roughness value of the Cu-NiO 1200 film was found to be 3.2 nm based on the atomic force microscopy (AFM) measurements. The deposited thin films of different thicknesses have been used as electrocatalysts for methanol oxidation at various concentrations of methanol (0, 0.5, 1, and 2 M), and displayed the highest electrocatalytic performance in 1 M methanol. Cu-doped NiO thin films have the advantage as electrocatalysts where they can be used directly without adding any binder or conducting agents, this is because Cu-doped NiO is deposited with high adhesion and strong electrical contact to the FTO substrate. A clear impact on the catalytic activity with increasing film thickness and a correlation between the film thickness and its catalytic activity was observed. The current density increased by about 60% for the Cu-NiO 1200 sample compared to Cu-NiO 300 sample, with the lowest onset potential of 0.4 V vs. Ag/AgCl. All deposited thin films of different thicknesses exhibited high stability at 0.6 V in 1 M methanol. This will open the window toward using physical deposition techniques for optimizing the electrocatalytic activity of different catalysts for electrocatalytic applications.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available