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Intrinsic stability of perovskite materials and their operational stability in light-emitting diodes

Journal

JOURNAL OF MATERIALS CHEMISTRY C
Volume 11, Issue 22, Pages 7159-7182

Publisher

ROYAL SOC CHEMISTRY
DOI: 10.1039/d2tc04798e

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Organic-inorganic hybrid perovskite material-based light-emitting diodes (PLEDs) have the potential to replace conventional LEDs in next-generation smart devices. However, the stability of PLEDs is a major concern due to ion migration, Joule heating, electrochemical reactions, and atmospheric moisture. Various strategies, such as optimizing material stoichiometry and device engineering, have been explored to overcome these challenges and improve the operational lifetime of perovskite-based LEDs.
Organic-inorganic hybrid perovskite material-based light-emitting diodes (PLEDs) can replace conventional LEDs for next-generation smart devices. The advantages of perovskite materials are narrow band emission, solution-processed device fabrication, and tunable band gaps. However, the stability of PLEDs is a major concern. Perovskite material-based LEDs suffer from ion migration due to the generated electric field during the device operation. Ion migration leads to the degradation of perovskite materials, charge transport layers and metal electrodes, resulting in the breakdown of PLEDs. Other factors for device instability include Joule heating, electrochemical interfacial reaction, atmospheric moisture, and others. Various strategies have been explored to mitigate these challenges, such as optimizing the stoichiometry of perovskite materials, introducing all inorganic element-based perovskite materials, encapsulating the emission layer, use of voltage pulse, device engineering, and defect-free low-bias operative PLEDs. The present review discusses the current status of perovskite-based LEDs in terms of operational stability, degradation mechanisms of perovskites, and strategies to overcome these challenges for a better operational lifetime.

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