Journal
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY
Volume 43, Issue 15, Pages 6916-6924Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.jeurceramsoc.2023.07.027
Keywords
X-type hexaferrites; Thin films; Chemical solution deposition; Spin reorientation transition
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This study reports the growth of epitaxial thin films of Sr2Co2Fe28O46 on a SrTiO3(111) substrate using a chemical solution deposition method. The orientation relationship between the film and substrate was determined to be (000l)X || (111)STO and [1120]X || [101]STO through X-ray diffraction analysis. The magnetization and magnetic domain structure were investigated using magnetic measurements and Lorentz transmission electron microscopy, revealing a spin reorientation transition and a change in magnetic anisotropy at different temperatures.
Although single crystals of hexaferrites have received considerable attention, the same does not apply for thin films. Here, the growth of epitaxial thin films of Sr2Co2Fe28O46 on a SrTiO3(111) by a chemical solution deposition method is reported. Using X-ray diffraction analysis, the orientation relationship between film and substrate was established as (000l)X || (111)STO and [1120]X || [101]STO. The magnetization and magnetic domain structure were investigated using magnetic measurements and Lorentz transmission electron microscopy, respectively. With changing temperature, the magnitude of magnetization in the (0001) plane changed at -355 K, while that along the [0001] direction remained almost unchanged, suggesting a spin reorientation transition. Using the ferromagnetic resonance method, it was shown that the compound exhibits a change in the orientation of the magnetic anisotropy in the (0001) plane at - 150 K that supports the occurrence of the multiaxial anisotropy state in film similar to that in single crystals.
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