Journal
NATURE COMMUNICATIONS
Volume 7, Issue -, Pages -Publisher
NATURE PUBLISHING GROUP
DOI: 10.1038/ncomms10783
Keywords
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Funding
- Spanish Ministry of Economy and Competitiveness, through the 'Severo Ochoa' Programme for Centres of Excellence in RD [SEV-2015-0522]
- Fundacio Cellex Barcelona
- ERC [294056, 307806]
- Government of Catalonia trough the SGR grant [2014-SGR-1535]
- Mineco grant Ramon y Cajal [RYC-2012-12281]
- Mineco grant Plan Nacional [FIS2013-47161-P]
- Mineco grant project GRASP [FP7-ICT-2013-613024-GRASP]
- E.C. (European Commission) under Graphene Flagship [CNECT-ICT-604391]
- Ramon y Cajal Fellowship Program
- US Office of Naval Research [N00014-13-1-0662]
- Spanish Ministry of Economy and Competitiveness
- 'Fondo Europeo de Desarrollo Regional [TEC2013-46168-R]
- AFOSR [FA9550-11-1-0225]
- Packard Fellowship program
- National Science Foundation (NSF) [DMR-0819762]
- NSF [ECS-0335765]
- Spanish Ministry of Economy and Competitiveness [MAT2012-33911]
- Secretaria de Universidades e Investigacion del Departamento de Economia y Conocimiento de la Generalidad de Catalunya
- Severo Ochoa Program [MINECO SEV-2013-0295]
- SECITI (Mexico, D.F.)
- ICREA Funding Source: Custom
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Optoelectronic devices utilizing graphene have demonstrated unique capabilities and performances beyond state-of-the-art technologies. However, requirements in terms of device quality and uniformity are demanding. A major roadblock towards high-performance devices are nanoscale variations of the graphene device properties, impacting their macroscopic behaviour. Here we present and apply non-invasive optoelectronic nanoscopy to measure the optical and electronic properties of graphene devices locally. This is achieved by combining scanning near-field infrared nanoscopy with electrical read-out, allowing infrared photocurrent mapping at length scales of tens of nanometres. Using this technique, we study the impact of edges and grain boundaries on the spatial carrier density profiles and local thermoelectric properties. Moreover, we show that the technique can readily be applied to encapsulated graphene devices. We observe charge build-up near the edges and demonstrate a solution to this issue.
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