Journal
ULTRAMICROSCOPY
Volume 162, Issue -, Pages 1-9Publisher
ELSEVIER
DOI: 10.1016/j.ultramic.2015.12.002
Keywords
Scanning probe microscopy; Scanning transmission electron microscopy; Drift correction; Image processing; Atomic resolution
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Funding
- Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy [DE-AC02-05CH11231]
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Unwanted motion of the probe with respect to the sample is a ubiquitous problem in scanning probe and scanning transmission electron microscopies, causing both linear and nonlinear artifacts in experimental images. We have designed a procedure to correct these artifacts by using orthogonal scan pairs to align each measurement line-by-line along the slow scan direction, by fitting contrast variation along the lines. We demonstrate the accuracy of our algorithm on both synthetic and experimental data and provide an implementation of our method. (C) 2015 Elsevier B.V. All rights reserved.
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