Journal
ULTRAMICROSCOPY
Volume 164, Issue -, Pages 1-10Publisher
ELSEVIER
DOI: 10.1016/j.ultramic.2016.03.003
Keywords
High resolution EBSD; Continuum dislocation microscopy; EBSD step size; Dislocation density
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Funding
- U.S. Department of Energy (DOE), Office of Science, Basic Energy Sciences (BES) [DE-SC0012587]
- National Science Foundation (NSF) [CMMI:14041404771]
- Div Of Civil, Mechanical, & Manufact Inn
- Directorate For Engineering [1404771] Funding Source: National Science Foundation
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Electron backscatter diffraction (EBSD) dislocation microscopy is an important, emerging field in metals characterization. Currently, calculation of geometrically necessary dislocation (GND) density is problematic because it has been shown to depend on the step size of the EBSD scan used to investigate the sample. This paper models the change in calculated GND density as a function of step size statistically. The model provides selection criteria for EBSD step size as well as an estimate of the total dislocation content. Evaluation of a heterogeneously deformed tantalum specimen is used to asses the method. (C) 2016 Elsevier B.V. All rights reserved.
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