4.5 Article

Circular dichroism measurements at an x-ray free-electron laser with polarization control

Journal

REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 87, Issue 8, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.4961470

Keywords

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Funding

  1. Department of Energy [DE-AC02-76SF00515]
  2. Volkswagen foundation within Peter Paul Ewald-Fellowship
  3. Knut and Alice Wallenberg foundation
  4. European XFEL
  5. DIPC
  6. program Physics with Accelerators and Reactors in West Europe of the Russian Ministry of Education and Science
  7. LOEWE initiative Electron Dynamics in Chiral Systems (ELCH)

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A non-destructive diagnostic method for the characterization of circularly polarized, ultraintense, short wavelength free-electron laser (FEL) light is presented. The recently installed Delta undulator at the LCLS (Linac Coherent Light Source) at SLAC National Accelerator Laboratory (USA) was used as showcase for this diagnostic scheme. By applying a combined two-color, multi-photon experiment with polarization control, the degree of circular polarization of the Delta undulator has been determined. Towards this goal, an oriented electronic state in the continuum was created by non-resonant ionization of the O-2 1s core shell with circularly polarized FEL pulses at hv similar or equal to 700 eV. An also circularly polarized, highly intense UV laser pulse with h. similar or equal to 3.1 eV was temporally and spatially overlapped, causing the photoelectrons to redistribute into so-called sidebands that are energetically separated by the photon energy of the UV laser. By determining the circular dichroism of these redistributed electrons using angle resolving electron spectroscopy and modeling the results with the strong-field approximation, this scheme allows to unambiguously determine the absolute degree of circular polarization of any pulsed, ultraintense XUV or X-ray laser source. Published by AIP Publishing.

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