Journal
CHINESE PHYSICS LETTERS
Volume 32, Issue 8, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0256-307X/32/8/088103
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Funding
- National Natural Science Foundation of China [61204006]
- Fundamental Research Funds for the Central Universities [7214570101]
- National Key Science and Technology Special Project [2008ZX01002-002]
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Hydride vapor phase epitaxy (HVPE) is utilized to grow nonpolar a-plane GaN layers on r-plane sapphire templates prepared by metal organic vapor phase epitaxy (MOVPE). The surface morphology and microstructures of the samples are characterized by atomic force microscopy. The full width at half maximum (FWHM) of the HVPE sample shows a W-shape and that of the MOVPE sample shows an M-shape plane with the degree of phi in the high-resolution x-ray diffraction (HRXRD) results. The surface morphology attributes to this significant anisotropic. HRXRD reveals that there is a significant reduction in the FWHM, both on-axis and off-axis for HVPE GaN are compared with the MOVPE template. The decrease of the FWHM of E-2 (high) Raman scattering spectra further indicates the improvement of crystal quality after HVPE. By comparing the results of secondary-ion-mass spectroscope and photoluminescence spectrum of the samples grown by HVPE and MOVPE, we propose that C-involved defects are originally responsible for the yellow luminescence.
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