Journal
PRAMANA-JOURNAL OF PHYSICS
Volume 87, Issue 5, Pages -Publisher
INDIAN ACAD SCIENCES
DOI: 10.1007/s12043-016-1285-8
Keywords
Transparent oxide; radio-frequency sputtering; optical properties; effect of annealing temperature
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Funding
- Taif University [1-435-3629]
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Transparent metal oxide thin films of samarium oxide (Sm2O3) were prepared on pre-cleaned fused optically flat quartz substrates by radio-frequency (RF) sputtering technique. The as-deposited thin films were annealed at different temperatures (873, 973 and 1073 K) for 4 h in air under normal atmospheric pressure. The topological morphology of the film surface was characterized by using atomic force microscopy (AFM). The optical properties of the as-prepared and annealed thin films were studied using their reflectance and transmittance spectra at nearly normal incident light. The estimated direct optical band gap energy (E-g(d)) values were found to increase by increasing the annealing temperatures. The dispersion curves of the refractive index of Sm2O3 thin films were found to obey the single oscillator model.
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