Journal
PHYSICS OF PLASMAS
Volume 23, Issue 2, Pages -Publisher
AIP Publishing
DOI: 10.1063/1.4942540
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Categories
Funding
- U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences [DE-AC02-76SF00515]
- LCLS
- Stanford University through the Stanford Institute for Materials Energy Sciences (SIMES)
- Lawrence Berkeley National Laboratory (LBNL)
- University of Hamburg through the BMBF [FSP 301]
- Center for Free Electron Laser Science (CFEL)
- UK EPSRC [EP/F020449/1, EP/H035877/1, EP/L000849/1]
- Royal Society
- Engineering and Physical Sciences Research Council [EP/F020449/1, EP/H035877/1, EP/L000849/1] Funding Source: researchfish
- EPSRC [EP/H035877/1, EP/L000849/1, EP/F020449/1] Funding Source: UKRI
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The possibility of creating hot-dense plasma samples by isochoric heating of solid targets with high-intensity femtosecond X-ray lasers has opened up new opportunities in the experimental study of such systems. A study of the X-ray spectra emitted from solid density plasmas has provided significant insight into the X-ray absorption mechanisms, subsequent target heating, and the conditions of temperature, electron density, and ionization stages produced (Vinko et al., Nature 482, 59-62 (2012)). Furthermore, detailed analysis of the spectra has provided new information on the degree of ionization potential depression in these strongly coupled plasmas (Ciricosta et al., Phys. Rev. Lett. 109, 065002 (2012)). Excellent agreement between experimental and simulated spectra has been obtained, but a full outline of the procedure by which this has been achieved has yet to be documented. We present here the details and approximations concerning the modelling of the experiment described in the above referenced work. We show that it is crucial to take into account the spatial and temporal gradients in simulating the overall emission spectra, and discuss how aspects of the model used affect the interpretation of the data in terms of charge-resolved measurements of the ionization potential depression. (C) 2016 AIP Publishing LLC.
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