Journal
ORGANIC ELECTRONICS
Volume 29, Issue -, Pages 1-6Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.orgel.2015.11.025
Keywords
Open-circuit voltage; Traps; Surface recombination; Light dependence
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An analytical model for the light intensity dependence of open circuit voltage V-oc in the presence of bimolecular, trap assisted and surface recombination mechanisms was proposed. The model quantitatively explains reported experimental deviations from the bimolecular and bimolecular/trap assisted recombination models. V-oc was found to be the most sensitive photoelectric parameter to surface recombination. The relative effect of surface recombination on V-oc increases with the increase of trap density as well as V-oc becomes more sensitive to the presence of deep traps due to surface recombination. In the presence of surface recombination slope V-oc vs. light intensity A does not reach value of 2.0 kT/q even at very high density of traps. Also a possible misinterpretation of the experimental V-oc vs. light intensity dependences in the presence of trap assisted and surface recombination was outlined. (C) 2015 Elsevier B.V. All rights reserved.
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