Accurate and fast 3D surface measurement with temporal-spatial binary encoding structured illumination

Balancing the accuracy and speed for 3D surface measurement of object is crucial in many important applications. Binary encoding pattern utilizing the high-speed image switching rate of digital mirror device (DMD)-based projector could be used as the candidate for fast even high-speed 3D measurement, but current most schemes only enable the measurement speed, which limit their application scopes. In this paper, we present a binary encoding method and develop an experimental system aiming to solve such a situation. Our approach encodes one computer-generated standard 8 bit sinusoidal fringe pattern into multiple binary patterns (sequence) with designed temporal-spatial binary encoding tactics. The binary pattern sequence is then high-speed and in-focus projected onto the surface of tested object, and then captured by means of temporal-integration imaging to form one sinusoidal fringe image. Further the combination of phase-shifting technique and temporal phase unwrapping algorithm leads to fast and accurate 3D measurement. The systematic accuracy better than 0.08mm is achievable. The measurement results with mask and palm are given to confirm the feasibility. (C) 2016 Optical Society of America