4.7 Article

Uncertainty quantification in DIC with Kriging regression

Journal

OPTICS AND LASERS IN ENGINEERING
Volume 78, Issue -, Pages 182-195

Publisher

ELSEVIER SCI LTD
DOI: 10.1016/j.optlaseng.2015.09.006

Keywords

Digital Image Correlation; Measurement error; Kriging regression; Uncertainty quantification

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Funding

  1. China Scholarship Council (CSC)
  2. University of Liverpool
  3. European Community's Seventh Framework Programme [NMP-SA-2012-319116]
  4. Royal Society Wolfson Research Merit Award

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A Kriging regression model is developed as a post-processing technique for the treatment of measurement uncertainty in classical subset-based Digital Image Correlation (DIC). Regression is achieved by regularising the sample-point correlation matrix using a local, subset-based, assessment of the measurement error with assumed statistical normality and based on the Sum of Squared Differences (SSD) criterion. This leads to a Kriging-regression model in the form of a Gaussian process representing uncertainty on the Kriging estimate of the measured displacement field. The method is demonstrated using numerical and experimental examples. Kriging estimates of displacement fields are shown to be in excellent agreement with 'true' values for the numerical cases and in the experimental example uncertainty quantification is carried out using the Gaussian random process that forms part of the Kriging model. The root mean square error (RMSE) on the estimated displacements is produced and standard deviations on local strain estimates are determined. (c) 2015 Elsevier Ltd. All rights reserved.

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