Journal
CHEMISTRY OF MATERIALS
Volume 27, Issue 7, Pages 2502-2506Publisher
AMER CHEMICAL SOC
DOI: 10.1021/cm5047676
Keywords
-
Funding
- National Science Foundation through the University of Pennsylvania's Nano/Bio Interface Center [DMR08-32802]
- MRSEC [DMR-1120901]
- U.S. Department of Energy, Office of Basic Energy Sciences [DE-SC0012704]
Ask authors/readers for more resources
Nanocrystals with anisotropic shape and high uniformity are now commonly produced as a result of significant advances in synthetic control. In most cases, the morphology of such materials is characterized only by electron microscopy, which makes the extraction of statistical information laborious and subject to bias. In this work, we describe how X-ray scattering patterns in conjunction with Debye formula simulations can be used to provide accurate atomisitic models for ensembles of anisotropic nanocrystals to complement and extend microscopic studies. Methods of sample preparation and measurement conditions are also discussed to provide appropriate experimental data. The scripts written to implement the Debye function are provided as a tool to allow researchers to obtain atomisitic models of nanocrystals.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available