Journal
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Volume 386, Issue -, Pages 8-15Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nimb.2016.09.019
Keywords
UO2; Single crystal; Ion irradiation; Thin film; Nano-structure; EBSD
Categories
Funding
- French Network EMIR
- UK EPSRC [EP/I036400/1]
- Radioactive Waste Management Ltd [NPO004411A-EPS02]
- EPSRC [EP/I036400/1] Funding Source: UKRI
- NERC [NE/L013398/1] Funding Source: UKRI
- Engineering and Physical Sciences Research Council [EP/I036400/1] Funding Source: researchfish
- Natural Environment Research Council [NE/L013398/1] Funding Source: researchfish
Ask authors/readers for more resources
This work presents the results of a detailed structural characterisation of irradiated and unirradiated single crystal thin films of UO2. Thin films of UO2 were produced by reactive magnetron sputtering onto (0 01), (1 1 0) and (1 1 1) single crystal yttria-stabilised zirconia (YSZ) substrates. Half of the samples were irradiated with 110 MeV U-238(31+) ions to fluences of 5 x 10(10), 5 x 10(11) and 5 x 10(12) ions/cm(2) to induce radiation damage, with the remainder kept for reference measurements. It was observed that as-produced UO2 films adopted the crystallographic orientation of their YSZ substrates. The irradiation fluences used in this study however, were not sufficient to cause any permanent change in the crystalline nature of UO2. It has been demonstrated that the effect of epitaxial re-crystallisation of the induced radiation damage can be quantified in terms of kernel average misorientation (KAM) and different crystallographic orientations of UO2 respond differently to ion irradiation. (C) 2016 The Authors. Published by Elsevier B.V.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available