4.7 Article

Microstructure and orientation evolution of β-Sn and interfacial Cu6Sn5 IMC grains in SAC105 solder joints modified by Si3N4 nanowires

Journal

JOURNAL OF MATERIALS RESEARCH AND TECHNOLOGY-JMR&T
Volume 26, Issue -, Pages 4723-4738

Publisher

ELSEVIER
DOI: 10.1016/j.jmrt.2023.08.186

Keywords

CTE; Si 3 N 4 nanowires; EBSD; Grain orientation

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This study showed that doping Si3N4 nanowires into SAC105 solder improved its thermal and mechanical properties, as well as optimized its CTE matching and grain orientation.
In this study, Si3N4 nanowires (NWs) with ceramic properties were incorporated into Sn1.0Ag0.5Cu (SAC105) solder to enhance its overall performance. The thermal properties, spreading behavior, microstructure, interface, and mechanical properties of SAC105-xSi(3)N(4) (x = 0, 0.2, 0.4, 0.6, 0.8, 1.0 wt%) solders were systematically investigated. The research revealed that doping Si3N4 NWs into SAC105 solder could expand its melting range and decrease undercooling. Notably, the solder alloy containing 0.6 wt% Si3N4 NWs had the lowest thermal expansion coefficient (CTE), which improved the CTE matching of SAC105 solder with Cu substrate. Although the solder with 0.4 wt% Si3N4 NWs exhibited superior wetting properties, it was less effective in refining the microstructure and interfacial intermetallic compounds (IMC) than those containing 0.6 wt% Si3N4 NWs. Meanwhile, when the beta-Sn phase in the matrix and the Cu6Sn5 IMC phase at the interface were analyzed by electron back scatter diffraction (EBSD), their grain orientation was found to be optimized by the doping of 0.6 wt% Si3N4 NWs. The <001> direction of the beta-Sn grains of SAC105-0.6Si(3)N(4) was perpendicular to the Cu substrate, showing a texture structure. The grain orientation of the interfacial Cu6Sn5 IMC made it well-adapted for three-dimensional (3D) packaging. Finally, the mechanical properties enhancement of the solder joints were analyzed in detail by combining the fracture morphology and the EBSD results of the Sn matrix.

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