Journal
NANOTECHNOLOGY
Volume 27, Issue 10, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0957-4484/27/10/105706
Keywords
Kelvin probe force microscopy; contact potential difference; dual harmonic KPFM; big data; multivariate statistical analysis
Funding
- Scientific User Facilities Division, Office of Basic Energy Sciences, US DOE
- US DOE, Basic Energy Sciences, Materials Sciences and Engineering Division through the Office of Science Early Career Research Program
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Since its inception over two decades ago, Kelvin probe force microscopy (KPFM) has become the standard technique for characterizing electrostatic, electrochemical and electronic properties at the nanoscale. In this work, we present a purely digital, software-based approach to KPFM utilizing big data acquisition and analysis methods. General mode (G-Mode) KPFM works by capturing the entire photodetector data stream, typically at the sampling rate limit, followed by subsequent de-noising, analysis and compression of the cantilever response. We demonstrate that the G-Mode approach allows simultaneous multi-harmonic detection, combined with on-the-fly transfer function correction-required for quantitative CPD mapping. The KPFM approach outlined in this work significantly simplifies the technique by avoiding cumbersome instrumentation optimization steps (i. e. lock in parameters, feedback gains etc), while also retaining the flexibility to be implemented on any atomic force microscopy platform. We demonstrate the added advantages of G-Mode KPFM by allowing simultaneous mapping of CPD and capacitance gradient (C') channels as well as increased flexibility in data exploration across frequency, time, space, and noise domains. G-Mode KPFM is particularly suitable for characterizing voltage sensitive materials or for operation in conductive electrolytes, and will be useful for probing electrodynamics in photovoltaics, liquids and ionic conductors.
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