Journal
IEEE TRANSACTIONS ON NEURAL NETWORKS AND LEARNING SYSTEMS
Volume 34, Issue 9, Pages 6602-6614Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNNLS.2021.3129321
Keywords
Kernel; Measurement; Support vector machines; Anomaly detection; Euclidean distance; Uncertainty; Learning systems; Distance metric; global image region; information entropy; local image region; novelty detection; support vector data description (SVDD)
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This paper introduces a novel support vector data description method called GL-SVDD, which uses distance metrics and probability densities to regularize the tradeoff parameter and shows encouraging performance in outlier detection.
In many practice application, the cost for acquiring abnormal data is quite expensive, thus the one-class classification (OCC) problem attracts great attention. As one of the solutions, support vector data description (SVDD) gains a continuous focus in outlier detection since it is based on the data description. For the sphere obtained by SVDD, both the center and the volume (or radius) strongly depend on the support vectors, while the support vectors are sensitive to the tradeoff parameter C. Hence, how to select this parameter is a rather challenging problem. In order to address this problem, we define several distance metrics relative to the image region in Gaussian kernel space. With the distance metrics, two probability densities relative to the global region and the local region are designed, respectively. Then, the information quantity and the information entropy are developed for regularizing the tradeoff parameter. This novel SVDD is called global plus local jointly regularized support vector data description (GL-SVDD), in which both the global region information and the local image region information jointly penalize the images as possible outliers. Finally, we use the UCI dataset and the hyperspectral data of cherry fruit to evaluate the performance of several OCC approaches. Experimental results show that GL-SVDD is encouraging.
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