Journal
NANO LETTERS
Volume 16, Issue 6, Pages 3434-3441Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acs.nanolett.5b04157
Keywords
Hybrid perovskite; photovoltaics; conductive AFM; PV performance
Categories
Funding
- National Science Foundation [DMR 1305913, OIA-1538893]
- DOE-BES-ESPM [DE-SC0005037]
- U.S. Department of Energy (DOE) [DE-SC0005037] Funding Source: U.S. Department of Energy (DOE)
- Office of Integrative Activities
- Office Of The Director [1538893] Funding Source: National Science Foundation
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Perovskite solar cells (PSCs) based on thin films of organolead trihalide perovskites (OTPs) hold unprecedented promise for low-cost, high-efficiency photovoltaics (PVs) of the future. While PV performance parameters of PSCs, such as short circuit current, open circuit voltage, and maximum power, are always measured at the macroscopic scale, it is necessary to probe such photoresponses at the nanoscale to gain key insights into the fundamental PV mechanisms and their localized dependence on the OTP thin-film microstructure. Here we use photoconductive atomic force microscopy spectroscopy to map for the first time variations of PV performance at the nanoscale for planar PSCs based on hole-transport-layer free methylammonium lead triiodide (CH3NH3PbI3 or MAPbI(3)) thin films. These results reveal substantial variations in the photoresponse that correlate with thin-film microstructural features such as intragrain planar defects, grains, grain boundaries, and notably also grain-aggregates. The insights gained into such microstructure-localized PV mechanisms are essential for guiding microstructural tailoring of OTP films for improved PV performance in future PSCs.
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