4.8 Article

Capillarity-Driven Welding of Semiconductor Nanowires for Crystalline and Electrically Ohmic Junctions

Journal

NANO LETTERS
Volume 16, Issue 8, Pages 5241-5246

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acs.nanolett.6b02361

Keywords

Silicon nanowires; capillarity-driven welding; percolation network; Ohmic junction; surface diffusion; finite-element simulation

Funding

  1. National Science Foundation (NSF) [DMR-1308695]
  2. UNC Energy Frontier Research Center (EFRC) Center for Solar Fuels, an EFRC - U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences [DE-SC0001011]
  3. NSF
  4. Packard Fellowship for Science and Engineering
  5. Sloan Research Fellowship
  6. NSF as part of the National Nanotechnology Coordinated Infrastructure (NNCI) [ECCS-1542015]
  7. Direct For Mathematical & Physical Scien
  8. Division Of Materials Research [1308695] Funding Source: National Science Foundation

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Semiconductor nanowires (NWs) have been demonstrated as a potential platform for a wide-range of technologies, yet a method to interconnect functionally encoded NWs has remained a challenge. Here, we report a simple capillarity-driven and self-limited welding process that forms mechanically robust and Ohmic inter-NW connections. The process occurs at the point-of-contact between two NWs at temperatures 400-600 degrees C below the bulk melting point of the semiconductor. It can be explained by capillarity driven surface diffusion, inducing a localized geometrical rearrangement that reduces spatial curvature. The resulting weld comprises two fused NWs separated by a single, Ohmic grain boundary. We expect the welding mechanism to be generic for all types of NWs and to enable the development of complex interconnected networks for neuromorphic computation, battery and solar cell electrodes, and bioelectronic scaffolds.

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