4.6 Article

Evaluation of the Vibration Signal during Milling Vertical Thin-Walled Structures from Aerospace Materials

Journal

SENSORS
Volume 23, Issue 14, Pages -

Publisher

MDPI
DOI: 10.3390/s23146398

Keywords

acceleration vibration; milling; vertical thin-walled elements; short-time Fourier transform; aerospace material; titanium alloy; nickel alloy

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Thin-walled structures are widely used to reduce weight and increase rigidity, and milling is a popular method for machining complex-shaped components. However, milling can lead to undesirable effects such as vibrations that affect surface quality and tool wear. Machining thin-walled structures is further complicated by the reduced workpiece rigidity.
The main functions of thin-walled structures-widely used in several industries-are to reduce the weight of the finished product and to increase the rigidity of the structure. A popular method for machining such components, often with complex shapes, is using milling. However, milling involves undesirable phenomena. One of them is the occurrence of vibrations caused by the operation of moving parts. Vibrations strongly affect surface quality and also have a significant impact on tool wear. Cutting parameters, machining strategies and tools used in milling constitute some of the factors that influence the occurrence of vibrations. An additional difficulty in milling thin-walled structures is the reduced rigidity of the workpiece-which also affects vibration during machining. We have compared the vibration signal for different approaches to machining thin-walled components with vertical walls made of Ti6Al4V titanium alloy and Inconel 625 nickel alloy. A general-purpose cutting tool for machining any type of material was used along with tools for high-performance machining and high-speed machining adapted for titanium and nickel alloys. A comparison of results was made for a constant material removal rate. The Short-Time Fourier Transform (STFT) method provided the acceleration vibration spectrograms for individual samples.

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