4.6 Article

Analysis of the characteristics of organic light-emitting diodes with single and mixed-host EML by impedance spectroscopy

Journal

ORGANIC ELECTRONICS
Volume 120, Issue -, Pages -

Publisher

ELSEVIER
DOI: 10.1016/j.orgel.2023.106850

Keywords

Mixed host EML; Impedance spectroscopy; Charge mobility and accumulation; Negative interfacial charge (NIC); Hole and electron split devices

Ask authors/readers for more resources

Impedance spectroscopy was applied to investigate the charge transportation and accumulation mechanisms in a mixed-host emissive layer (EML) of phosphorescent organic light-emitting diodes (OLEDs). The utilization of the same material as the mixed-host EML, in combination with the negative interfacial charges in the polarized TPBi material, led to enhanced current and power efficiency by eliminating energy barriers within the device. The capacitance-frequency (C-F) characteristics of the devices were simulated with an equivalent circuit to quantitatively determine the capacitance and resistance in each organic layer, providing insights into the improved electrical properties within the device.
Impedance spectroscopy was used to investigate the charge transportation and accumulation mechanisms in a mixed-host emissive layer (EML) of phosphorescent organic light-emitting diodes (OLEDs). 1, 3, 5-tris(1-phenyl1H-benzimidazole-2-yl)benzene (TPBi) and 4, 4 ', 4 ''-tris(N-carbazolyl)-triphenylamine (TCTA) materials were used as the electron transport and hole transport layers, respectively, to fabricate the mixed-host EML device. The results showed enhanced current and power efficiency owing to the use of the same material as the mixed-host EML, eliminating energy barriers within the device, coupled with the negative interfacial charges in the polarized TPBi material. The hole- and electron-split devices of the mixed-host EML OLED were analyzed to comprehensively understand the enhanced electrical properties within the device. Subsequently, the capacitance-frequency (C-F) characteristics of the devices were simulated with an equivalent circuit to quantitatively determine the capacitance and resistance in each organic layer at specific voltages (0-4 V) representing each characteristic step on the capacitance-voltage (C-V) curve.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available