Related references
Note: Only part of the references are listed.Slow coarsening of ultra-confined phase-separated glass thin films
B. Bouteille et al.
APPLIED PHYSICS LETTERS (2022)
Perfect depolarization in single scattering of light from uncorrelated surface and volume disorder
Jean-Philippe Banon et al.
OPTICS LETTERS (2020)
Single scattering of polarized light by correlated surface and volume disorder
J. -P. Banon et al.
PHYSICAL REVIEW A (2020)
Physics of polarized light scattering from weakly rough dielectric surfaces: Yoneda and Brewster scattering phenomena
J-P Banon et al.
PHYSICAL REVIEW A (2019)
Physical interpretation of Mueller matrix spectra: a versatile method applied to gold gratings
Meng Wang et al.
OPTICS EXPRESS (2017)
Dispersion of polarization coupling, localized and collective plasmon modes in a metallic photonic crystal mapped by Mueller Matrix Ellipsometry
Thomas Brakstad et al.
OPTICS EXPRESS (2015)
Polarization analysis of speckle field below its transverse correlation width : application to surface and bulk scattering
Jan Dupont et al.
OPTICS EXPRESS (2014)
Depolarization and enpolarization DOP histograms measured for surface and bulk speckle patterns
Ayman Ghabbach et al.
OPTICS EXPRESS (2014)
Statistical meaning of the differential Mueller matrix of depolarizing homogeneous media
Razvigor Ossikovski et al.
OPTICS LETTERS (2014)
Calculation of the Mueller matrix for scattering of light from two-dimensional rough surfaces
P. A. Letnes et al.
PHYSICAL REVIEW A (2012)
Characterization of plasmonic effects in thin films and metamaterials using spectroscopic ellipsometry
T. W. H. Oates et al.
PROGRESS IN SURFACE SCIENCE (2011)
Optics of surface disordered systems
I. Simonsen
EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS (2010)
Depolarized light scattering from colloidal gold nanoparticles
Krystyna Drozdowicz-Tomsia et al.
CHEMICAL PHYSICS LETTERS (2009)
Statistical signatures of random media and their correlation to polarization properties
Jacques Sorrentini et al.
OPTICS LETTERS (2009)
Off-diagonal Mueller matrix elements in backscattering from highly diffusive media
J Ellis et al.
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION (2002)
Measurement of roughness of two interfaces of a dielectric film by scattering ellipsometry
TA Germer
PHYSICAL REVIEW LETTERS (2000)
Share Paper
