Deflectometry based calibration of a deformable mirror for aberration correction and remote focusing in microscopy

Adaptive optics (AO) techniques enhance the capability of optical microscopy through precise control of wavefront modulations to compensate phase aberrations and improves image quality. However, the aberration correction is often limited due to the lack of dynamic range in existing calibration methods, such as interferometry or Shack-Hartmann (SH) wavefront sensors. Here, we use deflectometry (DF) as a calibration method for a deformable mirror (DM) to extend the available range of aberration correction. We characterised the dynamic range and accuracy of the DF-based calibration of DMs depending on the spatial frequency of the test pattern used in DF. We also demonstrated the capability of large magnitude phase control for remote-focusing over a range larger than was possible with SH sensing.

Automated summary

Adaptive optics (AO) techniques improve optical microscopy by compensating phase aberrations and enhancing image quality through precise wavefront modulation. Existing calibration methods, such as interferometry or Shack-Hartmann (SH) wavefront sensors, often have limited dynamic range, limiting aberration correction. By using deflectometry (DF) as a calibration method for deformable mirrors (DM), we extend the available range for aberration correction and demonstrate the capability of remote-focusing with large magnitude phase control beyond what SH sensing can achieve.