Journal
OPTICS EXPRESS
Volume 31, Issue 24, Pages 39893-39905Publisher
Optica Publishing Group
DOI: 10.1364/OE.506062
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An efficient and noise-resistant single-pixel imaging technique based on Pseudo-Zernike moments (PZ-SPI) is proposed in this paper. By modulating the illumination light fields and measuring the reflected light intensities, the object image can be reconstructed iteratively using the Pseudo-Zernike polynomials and moments. PZ-SPI shows good performance in low sampling ratios and background noise, expanding its application in complex environments.
An efficient and noise-resistant single-pixel imaging (SPI) technique based on Pseudo-Zernike moments (PZ-SPI) is proposed. In this technique, the illumination light fields are modulated to satisfy the Pseudo-Zernike polynomials. Then the modulated light fields are projected onto the object. And the single-pixel detector is used to measure the reflected light intensities to calculate the Pseudo-Zernike moments. Finally, the object image is reconstructed by iterative summation of the product of the Pseudo-Zernike polynomials and the Pseudo-Zernike moments. Through the numerical simulation and experimental demonstration, PZ-SPI can effectively reconstruct image at low sampling ratios. Besides, comparing with the Fourier-SPI and Zernike-SPI, PZ-SPI has good robustness to background noise in SPI system. These advantages expand the application of PZ-SPI in complex environments.
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