4.4 Article

A simulation method of gamma-ray phase contrast imaging for metal samples

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DOI: 10.1016/j.nima.2023.168321

Keywords

Phase contrast imaging; Inverse Compton scattering gamma-ray source; Monte Carlo; Huygens-Fresnel principle

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This paper introduces a simulation method of gamma-ray phase contrast imaging (PCI) based on the combination of Monte Carlo simulation and wave optics. The feasibility of this method is verified by comparing the simulation result of Young's double-slit experiment. A simulation of a concentric metal sample is carried out to demonstrate the potential of gamma-ray PCI, and the edge enhancement effect is observed at the interfaces of the sample. The simulation results preliminarily verify the feasibility of gamma-ray PCI for metallic materials.
Phase contrast imaging (PCI) for materials of low Z-index has been rapidly developed in recent years. And PCI is also considered to have great potential to improve the resolution of radiographic imaging of high-Z materials by using high-energy gamma-ray, but the research is still in its infancy. In this paper, we develop a simulation method of gamma-ray PCI, which is based on the combination of the Monte Carlo simulation and wave optics. The feasibility of this method is verified by comparing the simulation result of Young's double-slit experiment with its analytic result. To demonstrate the potential of gamma-ray PCI, a simulation of a concentric metal sample is carried out. The edge enhancement effect of PCI is clearly observed at the interfaces of the sample. The simulation results preliminarily verify the feasibility of gamma-ray PCI for metallic materials.

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