4.6 Article

Microwave dielectric properties of NaMgF3 ceramic

Journal

MATERIALS LETTERS
Volume 350, Issue -, Pages -

Publisher

ELSEVIER
DOI: 10.1016/j.matlet.2023.134933

Keywords

Electroceramics; Dielectrics; Sintering

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The microwave dielectric properties of NaMgF3 ceramics prepared by reactive sintering (RS) and conventional sintering (CS) processes were investigated. Both processes yielded phase pure NaMgF3 ceramics with relative densities of around 95%. By comparison, the RS sample showed lower sintering activation energy and larger grain size. However, both densified samples displayed similar microwave dielectric properties, which included a dielectric constant (er) of 6.9, a Q x f value of 63000 GHz, and a temperature coefficient of resonant frequency (rf) of -114 ppm/°C. Nevertheless, the large negative rf value needs to be further improved for practical applications.
Microwave dielectric properties of NaMgF3 ceramics prepared by reactive sintering (RS) and conventional sintering (CS) processes have been reported in this paper. Phase pure NaMgF3 ceramics with relative densities of -95% could be obtained at 800-950 & DEG;C/2h by both sintering processes. The RS sample demonstrates lower sintering activation energy and a much large grain size compared with the CS sample. Both densified samples exhibit similar microwave dielectric properties: er - 6.9, Q x f value -63000 GHz, and rf - -114 ppm/& DEG;C. However, the large negative rf value needs to be further improved for practical applications.

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