Quantifying Nanoparticle Layer Topography: Theoretical Modeling and Atomic Force Microscopy Investigations

A comprehensive method consisting of theoretical modeling and experimental atomic force microscopy (AFM) measurements was developed for the quantitative analysis of nanoparticle layer topography. Analytical results were derived for particles of various shapes such as cylinders (rods), disks, ellipsoids, hemispheres (caps), etc. It was shown that for all particles, their root-mean-square (rms) parameter exhibited a maximum at the coverage about 0.5, whereas the skewness was a monotonically decreasing function of the coverage. This enabled a facile determination of the particle coverage in the layer, even if the shape and size were not known. The validity of the analytical results was confirmed by computer modeling and experimental data acquired by AFM measurements for polymer nanoparticle deposition on mica and silica. The topographical analysis developed in this work can be exploited for a quantitative characterization of self-assembled layers of nano- and bioparticles, e.g., carbon nanotubes, silica and noble metal particles, DNA fragments, proteins, vesicles, viruses, and bacteria at solid surfaces. The acquired results also enabled a proper calibration, in particular the determination of the measurement precision, of various electron and scanning probe microscopies, such as AFM.

Automated summary

A comprehensive method combining theoretical modeling and experimental AFM measurements was developed to quantitatively analyze the topography of nanoparticle layers. The method is applicable to particles of various shapes and can determine the particle coverage by measuring parameters, regardless of the particle shape and size. The validity of the method was confirmed by computer modeling and experimental AFM data. This method can be used for the quantitative characterization of self-assembled layers of nano- and bioparticles.