Journal
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
Volume 34, Issue 31, Pages -Publisher
SPRINGER
DOI: 10.1007/s10854-023-11530-3
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The impact of crystallite size and thickness on the magnetic properties of Ni-Mn thin films prepared by electrode deposition technique is reported. The structural features, surface characteristics, composition, and magnetic behavior of the films were systematically investigated using XRD, SEM, EDX mapping, and VSM techniques. The results showed that the grain size and saturation magnetization values varied with the film thickness.
Herein, the impact of crystallite size and the thickness on the magnetic properties of Ni-Mn thin films prepared by electrode deposition technique is reported. The XRD, SEM, EDX mapping, and VSM studies systematically revealed the structural features, surface characteristics, composition, and magnetic behavior, respectively. Powder X-ray diffraction (XRD) analysis validated the mixed crystalline Cubic Ni and Tetragonal Mn phases. The scanning electron microscope (SEM) results revealed that surface morphology and grain size significantly changed with thickness of the films. The crystallite size is found to vary with the thickness and the saturation magnetization values showed a direct correlation with the film thickness, increasing from 40 to 200 emu/cm3 and from 33 to 187 emu/cm3 for in-plane and out-of-plane orientations, respectively.
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