Journal
JOURNAL OF ELECTROANALYTICAL CHEMISTRY
Volume 947, Issue -, Pages -Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.jelechem.2023.117791
Keywords
Copper Hexacyanoferrate thin film; Nickel Hexacyanoferrate thin film; Rare earth elements; Ion exchange kinetic mechanism
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This paper investigates electrodeposited films (NiHCF and CuHCF) as host materials for rare earth elements (REE), showing their capability for metal recovery. The ion insertion/release process was observed to be reversible for both heavy and light REEs, and a chemometric approach was used to study the amount of REEs inserted/released and the kinetic evolution.
In this paper, electrodeposited films belonging to the Prussian Blue Analogues (PBAs) family, namely, nickelhexacyanoferrate (NiHCF) and copper-hexacyanoferrate (CuHCF), were employed as a host material for rare earth elements (REE), and the reported insertion/release study reveals a recovery capability for such valuable metals. The ion insertion/release was accomplished by adopting an electrochemically-driven process. A reversible intercalation was observed while considering both heavy and ligth rare earth elements. The amount of REEs inserted/released over the process and its kinetic evolution during the process were also studied by a chemometric approach. For CuHCF, it was seen that the intercalation of heavy rare earth elements occurs easily respect to the light ones, suggesting a possible selectivity among these ions.
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