Journal
MICROSCOPY AND MICROANALYSIS
Volume 22, Issue 6, Pages 1261-1269Publisher
CAMBRIDGE UNIV PRESS
DOI: 10.1017/S1431927616012502
Keywords
TOF-SIMS; FIB; 3D tomography; chemical structure; SOFC
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Funding
- European Union's Seventh Framework Programme (FP7) [621173]
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In this paper the potential of time-of-flight secondary ion mass spectroscopy combined with focused ion beamtechnology to characterize the composition of a solid oxide fuel cell (SOFC) in three-dimension is demonstrated. The very high sensitivity of this method allows even very small amounts of elements/compounds to be detected and localized. Therefore, interlayer diffusion of elements between porous electrodes and presence of pollutants can be analyzed with a spatial resolution of the order of 100 nm. However, proper element recognition and mass interference still remain important issues. Here, we present a complete elemental analysis of the SOFC as well as techniques that help to validate the reliability of obtained results. A discussion on origins of probable artifacts is provided.
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