A Compact Front-End Circuit for a Monolithic Sensor in a 65-nm CMOS Imaging Technology

Article Instruments & Instrumentation

Design of an analog monolithic pixel sensor prototype in TPSCo 65 nm CMOS imaging technology

W. Deng et al.

Summary: A series of APTS chips, which are monolithic active pixel sensor prototypes, have been manufactured in the TPSCo 65 nm CMOS imaging process for the purpose of CERN-EP R&D on monolithic sensors and the ALICE ITS3 upgrade project. Each APTS chip consists of a 4 x 4 pixel matrix with fast analog outputs buffered to individual pads. Various pixel pitches, geometries, and reverse biasing schemes have been included to explore the process and sensor characteristics. The prototypes are fully functional and detailed sensor characterization is ongoing, with the design being presented along with experimental and transistor measurement results.

JOURNAL OF INSTRUMENTATION (2023)

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Article Instruments & Instrumentation

Design and readout architecture of a monolithic binary active pixel sensor in TPSCo 65 nm CMOS imaging technology

L. Cecconi et al.

Summary: The Digital Pixel Test Structure (DPTS) is a prototype chip designed to explore the TPSCo 65 nm ISC process for monolithic active pixel sensors in the context of the CERN-EP R&D on monolithic sensors and the ALICE ITS3 upgrade. It features a 32x32 binary pixel matrix with a pitch of 15 μm and event-driven readout, utilizing GHz range time-encoded digital signals that include Time-Over-Threshold. The chip has been proven fully functional and efficient in testbeam, enabling early verification of the complete sensor-to-readout chain. This paper focuses on the design of the digital readout and its prospects, along with supporting results.

JOURNAL OF INSTRUMENTATION (2023)

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Article Engineering, Electrical & Electronic

A 1-μW Radiation-Hard Front-End in a 0.18-μm CMOS Process for the MALTA2 Monolithic Sensor

F. Piro et al.

Summary: This article presents a low-power, radiation-hard front-end circuit for monolithic pixel sensors, designed to meet the requirements of low noise and low pixel-to-pixel variability to achieve high detection efficiencies.

IEEE TRANSACTIONS ON NUCLEAR SCIENCE (2022)

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Article Instruments & Instrumentation