4.7 Article

Flexible LNO Thin Film SAWR Strain Sensor Based on Polyimide Substrate

Journal

IEEE SENSORS JOURNAL
Volume 23, Issue 19, Pages 22350-22355

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JSEN.2023.3305486

Keywords

Crystal-ion-slicing (CIS) technology; high strain sensitivity; lithium niobite (LNO) surface acoustic wave resonator (SAWR); strain sensor

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In this study, a flexible single crystal LNO thin film was fabricated on a polyimide substrate using CIS technology and the BCB bonding method. Finite element method (FEM) simulation showed a surface acoustic wave resonator (SAWR) with a high Q factor. The SAWR strain sensors displayed good performance and a wider strain range compared to previous sensors.
Flexible single crystal 0 degrees YX lithium niobite (LNO) thin film is fabricated on a polyimide substrate combining crystal-ion-slicing (CIS) technology and the benzocyclobutene (BCB) bonding method. By finite element method (FEM) simulation, a surface acoustic wave resonator (SAWR) with a Q factor of 493 is demonstrated by increasing the thickness of the BCB layer. While applying compressively strain and tensile strain, the SAWR strain sensors show good performance with strain sensitivity of 587 Hz/mu epsilon and a wider strain range from -2231 or 2241 mu epsilon compared with our previous work in solidly mounted resonators (SMRs) and memristors. The repeatability testing while applying compressively strain and tensile strain is performed at two strain states of 0 and -1594 mu epsilon, and 0 and 1599 mu epsilon, respectively. As changing the strain value, the resonance frequency shows great consistency and displays good repeatability and high stability, indicating that the flexible LNO SAWR strain sensor has potentially applicable in flexible electronics systems.

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