Journal
FERROELECTRICS
Volume 612, Issue 1, Pages 81-86Publisher
TAYLOR & FRANCIS LTD
DOI: 10.1080/00150193.2023.2211308
Keywords
BNFNO; atomic force microscopy; X-ray diffraction; >
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This paper presents the study results of barium-neodymium ferroniobate films with thicknesses of 180 and 980 nm obtained by RF cathode sputtering. Through X-ray diffraction and magnetic force microscopy, it was found that the films are single-phase, epitaxial, and free from magnetic impurities. Atomic force microscopy data indicates that the growth of the films follows the Volmer-Weber mechanism.
The paper presents the study results of barium-neodymium ferroniobate films with a thickness of 180 and 980 nm obtained by RF cathode sputtering. Using X-ray diffraction and magnetic force microscopy, we found that the films are single-phase, epitaxial and do not contain magnetic impurities. Atomic force microscopy data show that the films grow according to the Volmer-Weber mechanism.
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