4.7 Article

Nanoclusters in stacking faults in Mg-Y-Zn alloys examined by small-angle X-ray scattering and extended X-ray absorption fine structure analysis

Journal

ACTA MATERIALIA
Volume 253, Issue -, Pages -

Publisher

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.actamat.2023.118963

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A coarse-grained picture of segregation layers in MgYZn alloys has been confirmed, where the layers are two-dimensional cluster systems bound in stacking faults. The use of EXAFS, small-angle X-ray scattering, and scanning tunneling microscopy showed that the atomic configurations around Y and Zn atoms in the segregation layers are identical, indicating the presence of L12 clusters. This fingerprint was observed in both bulk LPSO structures and dilute MgYZn alloys.
A coarse-grained picture of segregation layers in MgYZn alloys as a two-dimensional cluster systems bound in stacking faults has been justified by a combined use of Extended X-ray absorption fine structure (EXAFS), smallangle X-ray scattering, and scanning tunneling microscopy. EXAFS analysis showed an identical relaxed atomic configuration around Y and Zn atoms as a finger print of molecular-like L12 clusters, characteristic of Long Period Stacking Ordered (LPSO) structures. The fingerprint was confirmed for wide range of compositions of cast ternary alloys containing bulk LPSO structures. The clusters in dilute MgYZn alloys, whose segregation layers were sparsely dispersed in the a-Mg matrix, showed the same fingerprint. The results suggested that the Y-Zn clusters in the segregation layers of Mg-Y-Zn alloys are identical, regardless of the cluster density in the layers or the number of segregation layers.

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