Temperature-Dependent Conduction and Photoresponse in Few-Layer ReS2

The electrical behavior and the photoresponse of rhenium disulfide field-effect transistors (FETs) have been widely studied; however, only a few works have investigated the photocurrent as a function of temperature. In this paper, we perform the electrical characterization of few-layer ReS2-based FETs with Cr-Au contacts over a wide temperature range. We exploit the temperature-dependent transfer and output characteristics to estimate the effective Schottky barrier at the Cr-Au/ReS2 interface and to investigate the temperature behavior of parameters, such as the threshold voltage, carrier concentration, mobility, and subthreshold swing. Through time-resolved photocurrent measurements, we show that the photocurrent increases with temperature and exhibits a linear dependence on the incident light power at both low and room temperatures and a longer rise/decay time at higher temperatures. We surmise that the photocurrent is affected by the photobolometric effect and light-induced desorption of adsorbates which are facilitated by the high temperature and the low pressure.

Automated summary

The electrical behavior and photoresponse of rhenium disulfide field-effect transistors (FETs) with Cr-Au contacts were investigated, and their temperature-dependent characteristics were studied. The photocurrent was found to increase with temperature and showed a linear dependence on the incident light power at low and room temperatures, with longer rise/decay time at higher temperatures.