Journal
MATERIALS LETTERS
Volume 162, Issue -, Pages 71-74Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.matlet.2015.09.102
Keywords
Thin films; Sputtering; X-ray diffraction; Raman spectroscopy; Luminescence
Funding
- UGC-BSR, New Delhi, India [F.25-1/2013-14(BSR)/7-14/2007 (BSR)]
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CeO2 and Ni-CeO2 thin films with cubic fluorite structure were prepared by rf magnetron sputtering. Crystallinity and optical properties of the prepared thin films were studied using X-ray diffraction, UV-vis and Photo Luminescence analysis. Vibrational and magnetic properties of the films were analysed through Raman and VSM analyses. The results from XRD and Raman spectroscopy indicate that doped Ni species were dispersed on the ceria surface. Room temperature magnetic measurements reveal paramagnetic nature of pure CeO2 thin films and ferromagnetic nature with reasonable saturation magnetisation (4.03 x 10(-5) emu/cm(3)) of Ni doped CeO2 thin films. It is believed that the ferromagnetic contributions exhibited in the M-H loops originate from the absorptive oxygen on the surface rather than the oxygen vacancies in the lattice. (C) 2015 Elsevier B.V. All rights reserved.
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