Journal
MATERIALS CHEMISTRY AND PHYSICS
Volume 183, Issue -, Pages 320-325Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.matchemphys.2016.08.034
Keywords
Thin film; Chemical bath deposition; Microstrain; Preferred orientation; X-ray diffraction
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Lead selenide (PbSe) nanocrystalline thin films have been deposited on silica glass substrates by the chemical bath deposition technique. The samples were deposited at the bath temperatures of 60, 75 and 90 degrees C respectively and characterized by a variety of techniques. The XRD results revealed that the PbSe thin film deposited at 60 degrees C was amorphous in nature. Films deposited at higher temperatures exhibited sharp and intense diffraction peaks, indicating an improvement in crystallinety. The deposition temperature also had a strong influence on the preferred orientation of the crystallites as well as other structural parameters such as microstrain and dislocation density. From the SEM study it was observed that film deposited at 90 degrees C had well defined crystallites, uniformly distributed over the entire surface of the substrate. The EDAX study confirmed that the samples deposited at the higher temperature had a better stoichiometric ratio. The optical band gap varied from 2.26 eV to 1.13 eV with increasing deposition temperature. (C) 2016 Elsevier B.V. All rights reserved.
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