4.6 Article

A Wireless, Battery-Powered Probe Based on a Dual-Tier CMOS SPAD Array for Charged Particle Sensing

Journal

ELECTRONICS
Volume 12, Issue 11, Pages -

Publisher

MDPI
DOI: 10.3390/electronics12112549

Keywords

SPAD; wireless detection probe; battery powered; DCR; SiPM; dual layer

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A compact probe for charged particle imaging has been designed and tested, showing potential applications in source activity mapping and radio-guided surgery. The development of this technology is of great significance for medical imaging, providing accurate and efficient tools for diagnoses and treatments. The probe is designed for portability, powered by batteries and capable of wireless communication with a PC. Its core sensor is a dual-layer CMOS SPAD detector fabricated using 150 nm technology, which effectively reduces the dark count rate (DCR) through overlapping cells. The probe's performance has been evaluated by characterizing the on-board SPAD detector, with consistent results compared to benchtop measurements on the same chip samples.
A compact probe for charged particle imaging, with potential applications in source activity mapping and radio-guided surgery was designed and tested. The development of this technology holds significant implications for medical imaging, offering healthcare professionals accurate and efficient tools for diagnoses and treatments. To fulfill the portability requirements of these applications, the probe was designed for battery operation and wireless communication with a PC. The core sensor is a dual-layer CMOS SPAD detector, fabricated using 150 nm technology, which uses overlapping cells to produce a coincidence signal and reduce the dark count rate (DCR). The sensor is managed and interfaced with a microcontroller, and custom firmware was developed to facilitate communication with the sensor. The performance of the probe was evaluated by characterizing the on-board SPAD detector in terms of the DCR, and the results were consistent with the characterization measurements taken on the same chip samples using a purposely developed benchtop setup.

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