Journal
FRONTIERS IN CHEMISTRY
Volume 11, Issue -, Pages -Publisher
FRONTIERS MEDIA SA
DOI: 10.3389/fchem.2023.1120092
Keywords
NanoSIMS; sulfur isotope analysis; isotopic images; spatial resolution; analytical precision
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A new method based on NanoSIMS imaging mode is reported, which simultaneously improves the spatial resolution and precision of sulfur isotopic analysis. The method uses a long acquisition time and a small primary beam size to obtain sufficient signal amount. The sulfur isotopic composition is acquired through interpolation correction and calculation of calibrated isotopic images. This imaging analysis is superior to spot-mode analysis in irregular analytical areas where high spatial resolution and precision are required.
NanoSIMS has been widely used for in-situ sulfur isotopic analysis (S-32 and S-34) of micron-sized grains or complex zoning in sulfide in terrestrial and extraterrestrial samples. However, the conventional spot mode analysis is restricted by depth effects at the spatial resolution < 0.5-1 mu m. Thus sufficient signal amount cannot be achieved due to limited analytical depths, resulting in low analytical precision (1.5 parts per thousand). Here we report a new method that simultaneously improves spatial resolution and precision of sulfur isotopic analysis based on the NanoSIMS imaging mode. This method uses a long acquisition time (e.g., 3 h) for each analytical area to obtain sufficient signal amount, rastered with the Cs+ primary beam of similar to 100 nm in diameter. Due to the high acquisition time, primary ion beam (FCP) intensity drifting and quasi-simultaneous arrival (QSA) significantly affects the sulfur isotopic measurement of secondary ion images. Therefore, the interpolation correction was used to eliminate the effect of FCP intensity variation, and the coefficients for the QSA correction were determined with sulfide isotopic standards. Then, the sulfur isotopic composition was acquired by the segmentation and calculation of the calibrated isotopic images. The optimal spatial resolution of similar to 100 nm (Sampling volume of 5 nm x 1.5 mu m(2)) for sulfur isotopic analysis can be implemented with an analytical precision of similar to 1 parts per thousand (1SD). Our study demonstrates that imaging analysis is superior to spot-mode analysis in irregular analytical areas where relatively high spatial resolution and precision are required and may be widely applied to other isotopic analyses.
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