Journal
MICROMACHINES
Volume 14, Issue 5, Pages -Publisher
MDPI
DOI: 10.3390/mi14050973
Keywords
carbon nanotubes; field emission; logic gate; MEMS; vacuum microelectronics
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This paper presents a fully integrated vacuum microelectronic NOR logic gate that uses microfabricated polysilicon panels with integrated carbon nanotube field emission cathodes. The gate consists of two parallel vacuum tetrodes fabricated using polysilicon Multi-User MEMS Processes. Each tetrode exhibits transistor-like performance, but with a low transconductance due to a coupling effect between the anode voltage and cathode current. The NOR logic capabilities are demonstrated by the parallel operation of the tetrodes, although the device exhibits asymmetric performance.
This paper demonstrates a fully integrated vacuum microelectronic NOR logic gate fabricated using microfabricated polysilicon panels oriented perpendicular to the device substrate with integrated carbon nanotube (CNT) field emission cathodes. The vacuum microelectronic NOR logic gate consists of two parallel vacuum tetrodes fabricated using the polysilicon Multi-User MEMS Processes (polyMUMPs). Each tetrode of the vacuum microelectronic NOR gate demonstrated transistor-like performance but with a low transconductance of 7.6 x 10(-9) S as current saturation was not achieved due to a coupling effect between the anode voltage and cathode current. With both tetrodes working in parallel, the NOR logic capabilities were demonstrated. However, the device exhibited asymmetric performance due to differences in the CNT emitter performance in each tetrode. Because vacuum microelectronic devices are attractive for use in high radiation environments, to test the radiation survivability of this device platform, we demonstrated the function of a simplified diode device structure during exposure to gamma radiation at a rate of 45.6 rad(Si)/second. These devices represent a proof-of-concept for a platform that can be used to build intricate vacuum microelectronic logic devices for use in high-radiation environments.
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