Is There an Answer?

Back When I first got into the electronic test, over 40 years ago, things were simple. You applied a test to a chip, usually a functional test, and you got a result. The expected value, obtained during simulation, was a series of vectors, ones, and zeroes, which was simple to compare with the circuit output. If your simulation and test program were good, the outputs would match except when the circuit was faulty.

Automated summary

Over 40 years ago, when I first started in electronic testing, it was a straightforward process. Testing involved applying a functional test to a chip and obtaining a result. The expected values, generated through simulation, consisted of simple vectors of ones and zeroes, which could be easily compared with the circuit output. If the simulation and test program were reliable, the outputs would match unless there was a circuit fault.