4.7 Article

Genetic analysis and mapping of dwarf gene without yield penalty in a γ-ray-induced wheat mutant

Journal

FRONTIERS IN PLANT SCIENCE
Volume 14, Issue -, Pages -

Publisher

FRONTIERS MEDIA SA
DOI: 10.3389/fpls.2023.1133024

Keywords

wheat; plant height; dwarf mutant; QTL; gamma-ray

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In this study, a semi-dwarf mutant jg0030 induced by ?-ray mutagenesis was identified in wheat. The mutant showed a reduced plant height compared to the wild type and exhibited no changes in yield-related traits. The dwarf gene was mapped to a specific region on chromosome 2B using different molecular techniques. This study provides valuable genetic resources and linked markers for wheat improvement in breeding programs.
Plant height is one of the most important agronomic traits that affects yield in wheat, owing to that the utilization of dwarf or semi-dwarf genes is closely associated with lodging resistance. In this study, we identified a semi-dwarf mutant, jg0030, induced by ?-ray mutagenesis of the wheat variety 'Jing411' (wild type). Compared with the 'Jing411', plant height of the jg0030 mutant was reduced by 7%-18% in two years' field experiments, and the plants showed no changes in yield-related traits. Treatment with gibberellic acid (GA) suggested that jg0030 is a GA-sensitive mutant. Analysis of the frequency distribution of plant height in 297 F-3 families derived from crossing jg0030 with the 'Jing411' indicated that the semi-dwarf phenotype is controlled by a major gene. Using the wheat 660K SNP array-based Bulked Segregant Analysis (BSA) and the exome capture sequencing-BSA assay, the dwarf gene was mapped on the long arm of chromosome 2B. We developed a set of KASP markers and mapped the dwarf gene to a region between marker PH1 and PH7. This region encompassed a genetic distance of 55.21 cM, corresponding to a physical distance of 98.3 Mb. The results of our study provide a new genetic resource and linked markers for wheat improvement in molecular breeding programs.

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