4.6 Article

Synthesis and characterization of 11B4C containing Ni/Ti multilayers using combined neutron and X-ray reflectometry

Journal

OPTICAL MATERIALS EXPRESS
Volume 13, Issue 4, Pages 1140-1149

Publisher

Optica Publishing Group
DOI: 10.1364/OME.481049

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This study shows that the interface width of Ni/Ti multilayers can be improved by incorporating low-neutron-absorbing 11B4C and applying a modulated ion-assistance scheme. The accumulated roughness is eliminated in the 11B4C-containing multilayers, resulting in a mean interface width of 4.5 angstrom and an increase in reflectivity at the first Bragg peak by a factor of 2.3 and 1.5 for neutron and X-ray measurements, respectively.
The performance of multilayers in optical components, such as those used in neutron scattering instruments, is crucially dependent on the achievable interface width. We have shown how the interface width of Ni/Ti multilayers can be improved using the incorporation of B4C to inhibit the formation of nanocrystals and limit interdiffusion and intermetallic reactions at the interfaces. A modulated ion-assistance scheme was used to prevent intermixing and roughness accumulation throughout the layer stack. In this work we investigate the incorporation of low-neutron-absorbing 11B4C for Ni/Ti neutron multilayers. Combined fitting of neutron reflectivity and X-ray reflectivity measurements shows an elimination of accumulated roughness for the 11B4C containing multilayers with a mean interface width of 4.5 angstrom, resulting in an increase in reflectivity at the first Bragg peak by a factor of 2.3 and 1.5 for neutron and X-ray measurements, respectively.

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