Journal
THIN SOLID FILMS
Volume 768, Issue -, Pages -Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2023.139685
Keywords
Magnetron sputtering; Cadmium zinc telluride; Thin film; Surface morphology; Conductive mechanism
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In this study, different morphologies of CdZnTe films were prepared and characterized. The pebble-like grain film showed randomly arranged CdZnTe crystal cells and higher resistivity. The worm-like grain film had the lowest absorption coefficient in visible light range, while the hexagonal grain film had the largest particle size, best crystallinity, and lowest resistivity. The conductive mechanism of CdZnTe films with different morphologies was also discussed.
The polycrystalline CdZnTe films are promising material for fabrication of X-ray detection and solar cells. In this study, a pebble-like grain, hexagonal grain and worm-like grain of CdZnTe films were prepared via radio frequency magnetron sputtering. The morphology and properties of CdZnTe films were then characterized using atomic force microscopy, 2-D grazing-incidence wide-angle X-ray scattering, Raman spectra, transmission spectra and current-voltage curves. Accordingly, the CdZnTe crystal cell was found to be haphazardly arranged in the pebble-like grain, consequently demonstrating less anisotropy. In addition, the pebble-like grain film possessed a higher resistivity in light of the reduced anisotropy. In regard to the worm-like grain and hexagonal grain films, most CdZnTe (111) crystal planes were noted to be parallel to the sample surface. The worm-like grain film had the lowest absorption coefficient within the visible light range. Furthermore, the hexagonal grain film was shown to have the largest particle size, best crystallinity and lowest resistivity. The conductive mechanism of CdZnTe films of different morphologies was also discussed.
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