Journal
OPTICS EXPRESS
Volume 31, Issue 13, Pages 22250-22259Publisher
Optica Publishing Group
DOI: 10.1364/OE.493302
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Vernier effect-based optical fiber sensors have been used for high-sensitivity measurements of various physical and chemical parameters. This study demonstrates the dynamic sensing capability of a low-cost and intelligent Vernier sensor with the assistance of machine learning-based analysis technique.
Vernier effect-based optical fiber sensors have been demonstrated for high-sensitivity measurements of a diverse array of physical and chemical parameters. The interrogation of a Vernier sensor typically needs a broadband source and an optical spectrum analyzer to measure amplitudes over a broad wavelength window with dense sampling points, facilitating accurate extraction of the Vernier modulation envelope for sensitivity-improved sensing. However, the stringent requirement on the interrogation system limits the dynamic sensing capability of Vernier sensors. In this work, the possibility of employing a light source with a small wavelength bandwidth (35 nm) and a coarsely resolved spectrometer (& SIM;166 pm) for the interrogation of an optical fiber Vernier sensor is demonstrated with the assistance of a machine learning-based analysis technique. Dynamic sensing of the exponential decay process of a cantilever beam has been successfully implemented with the low-cost and intelligent Vernier sensor. This work represents a first step towards a simpler, faster, and cheaper way to characterize the response of optical fiber sensors based on the Vernier effect.& COPY; 2023 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement
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