4.4 Article

A digital calibration technique for N-channel time-interleaved ADC based on simulated annealing algorithm

Journal

MICROELECTRONICS JOURNAL
Volume 133, Issue -, Pages -

Publisher

ELSEVIER SCI LTD
DOI: 10.1016/j.mejo.2023.105701

Keywords

Time-interleaved analog -to -digital converter; Digital calibration; Frequency response mismatches; Differential filter; Simulated annealing algorithm

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This study proposes a digital calibration technique for time-interleaved analog-to-digital converters with any interleaving factor, which can calibrate gain, timing, and bandwidth mismatches. A simulated annealing algorithm is used to search the optimum calibration coefficients for the error correction module, possessing a customizable search range and precision. Furthermore, the calibration technique is effective for the single-tone and multi-tone input signals in the whole Nyquist frequency. In the case of an 8-channel 12-bit TI-ADC with fixed mismatches, simulations show an SNDR improvement of 46.38 dB for a single-tone input and an SNDR improvement of 29.23 dB for a multi-tone input.
This work proposes a digital calibration technique for time-interleaved analog-to-digital converters with any interleaving factor, which can calibrate gain, timing, and bandwidth mismatches. A simulated annealing algo-rithm is used to search the optimum calibration coefficients for the error correction module, possessing a cus-tomizable search range and precision. Furthermore, the calibration technique is effective for the single-tone, and multi-tone input signals in the whole Nyquist frequency. In the case of an 8-channel 12-bit TI-ADC with fixed mismatches, simulations show an SNDR improvement of 46.38 dB for a single-tone input and an SNDR improvement of 29.23 dB for a multi-tone input.

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