Multi-scale textured PEEK surfaces obtained by direct laser interference patterning using IR ultra-short pulses

In this work, we aimed at getting the first insight into the influence of the laser processing parameters on the production of functional multi-scale PEEK surfaces using the Direct Laser Interference Patterning technology. An infrared ultra-short pulsed laser source (1064 nm, 10 ps) and a two-beam interference setup were used. The fabricated structures morphology was analyzed by Scanning Electron Microscopy and Confocal Microscopy. As a result, line-like structures with periodic spatial repetition (p) at two levels were produced: main structures with p = 5 mu m and mean depth values up to -2.5 mu m (aspect ratio of -0.5) and secondary structures, perpendicularly oriented relative to the main structures, formed at DLIP maxima position (top part of ridges) with p approximate to 1 mu m (LIPSS).

Automated summary

In this study, the influence of laser processing parameters on the production of functional multi-scale PEEK surfaces using Direct Laser Interference Patterning (DLIP) technology was investigated. An infrared ultra-short pulsed laser source and a two-beam interference setup were utilized. The fabricated structures were characterized by Scanning Electron Microscopy and Confocal Microscopy, revealing the formation of line-like main structures with a periodic spatial repetition of 5 μm and secondary structures perpendicular to the main structures with a periodicity of approximately 1 μm (LIPSS) at DLIP maxima positions.