Multi voltage SEM-EDX analysis of metals in historical textiles

This paper discusses advantages and limits of previously reported approach of using multi voltage scanning electron microscopy-energy dispersive X-ray spectroscopy (MV SEM-EDX) surface data [1]. Results showed that gilt Au thicknesses can be measured approximately up to 300 nm at 25 kV. The method is particularly useful for determining simple alloys (such as Au and Ag) and compounds (such as Ag2S) with the observation of constant weight ratios for the alloys and compounds (0.15 for Ag2S) in the historical and archaeological textiles. Results showed that beam penetration depth in Ag2S is1800 nm at 25 kV.

Automated summary

This paper discusses the advantages and limitations of using the MV SEM-EDX surface data for measuring gilt Au thicknesses and determining simple alloys and compounds in historical and archaeological textiles. Results indicate that the method can measure gilt Au thicknesses up to approximately 300 nm at 25 kV and is particularly useful for determining simple alloys and compounds with constant weight ratios. The beam penetration depth in Ag2S at 25 kV is found to be 1800 nm.